Novel Approach of Semiconductor BEOL Processes Integration

The performance of the manufacturing process in each of these areas determines the overall manufacturability of the process. As device geometries are reduced, understanding and minimizing the sources of process-induced defects is critical to achieving and maintaining high device yields. This paper presents comprehensive the investigating a novel metrology on semiconductor process module integration and technology on optimal integrated lithography processes and solution to the problem of defects reduction on semiconductor wafer in sub-micron processes integration. As duel damascene integration copper process is complicated and critical in semiconductor processes. It has been common knowledge that pattern collapse and missing of this process and numerous defects could be prevented by optimal the process module tuning. To investigate novel semiconductor process integration on deep pattern aspect ratio effects of sub-micron CMOS semiconductor BEOL (Back-End-Of-Line) structure were included in this study. Moreover, the electrical device investigations of device checking were also included.